Assoc. Professor Ian Gentle
The Brisbane Surface Analysis Facility
Department of Chemistry
The University of Queensland
Brisbane, QLD, 4072
Australia
Email: gentle@chemistry.uq.edu.au
Ph : +61 7 3365 4800
Fax: +61 7 3365 4299
Associate Professor Gentle has established an international profile in the fabrication and characterisation of thin films, using a number of advanced methods. In particular, he has pioneered a number of methods using synchrotron radiation for the analysis of films as thin as a single monolayer. Because these methods are so much more efficient than traditional scanning methods, real-time dynamic measurements of, for example, the diffraction from films undergoing phase transitions are possible for the first time. Because of this expertise, he has served on a number of committees giving advice to governments and industry on synchrotron applications in this field and many others. These include Specialist Committees for the Australian Synchrotron Research Program, the National Scientific Advisory Committee of the Australian Synchrotron Facility and acting as the Program Scientific Manager for the Boomerang Consortium in the Major National Research Facilities application. He is also the Director of the Brisbane Surface Analysis Facility.
